لوحات الاختبار: ثقوب ربط عمياء/مدفونة عالية الكثافة للأجهزة ذات العدد الكبير من المسامير
The semiconductor industry is on a relentless pursuit of miniaturization, increased functionality, and higher processing speeds. As integrated circuits (ICs) become more complex, the packaging technologies housing them must evolve correspondingly. This evolution has led to a dramatic increase in pin counts and a significant reduction in pin pitch, particularly in packages like Ball Grid […]